15 September 2006 Optical full-field measurement of strain at a microscopic scale with the grid method
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Proceedings Volume 6341, Speckle06: Speckles, From Grains to Flowers; 63412U (2006) https://doi.org/10.1117/12.695991
Event: Speckle06: Speckles, From Grains to Flowers, 2006, Nimes, France
Abstract
In this work, a new micro-extensometric technique to study the local heterogeneities of strain fields in metallic alloys is introduced. It is based on the optical full-field measurement method called the grid method adapted to the micrometric scale. In the first part of the paper, the making of a periodic grating at the surface of the sample by direct interferometric photolithography is explained. The optimization of the grids in terms of phase noise is then addressed.
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Raphaël Moulart, René Rotinat, Fabrice Pierron, Gilles Lerondel, and Pascal Royer "Optical full-field measurement of strain at a microscopic scale with the grid method", Proc. SPIE 6341, Speckle06: Speckles, From Grains to Flowers, 63412U (15 September 2006); doi: 10.1117/12.695991; https://doi.org/10.1117/12.695991
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