15 September 2006 Ellipsometry of speckle patterns for the analysis of optical inhomogeneities (surfaces and bulks)
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Proceedings Volume 6341, Speckle06: Speckles, From Grains to Flowers; 63412V (2006) https://doi.org/10.1117/12.695993
Event: Speckle06: Speckles, From Grains to Flowers, 2006, Nimes, France
Abstract
Far field light scattering from rough surfaces and inhomogeneous bulks has extensively been studied these last decades, with a major application in random media characterization. Angular Resolved measurements are performed and investigated thanks to the development of electromagnetic models. The studies are extended to the case of high angular resolution, that's mean to the speckle pattern. We show that the analysis of the polarization state of the scattered field permits to complete this study and to identify signatures of the different polarization sources which are surfaces or bulks. An application will then be to annul each scattering source in order to select the characterized element.
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Gaëlle Georges, Gaëlle Georges, Laurent Arnaud, Laurent Arnaud, Carole Deumié, Carole Deumié, Claude Amra, Claude Amra, } "Ellipsometry of speckle patterns for the analysis of optical inhomogeneities (surfaces and bulks)", Proc. SPIE 6341, Speckle06: Speckles, From Grains to Flowers, 63412V (15 September 2006); doi: 10.1117/12.695993; https://doi.org/10.1117/12.695993
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