24 July 2006 Forward tracing technique for diffraction analysis of apertures in optical systems
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Proceedings Volume 6342, International Optical Design Conference 2006; 63420K (2006) https://doi.org/10.1117/12.692245
Event: International Optical Design Conference 2006, 2006, Vancouver, BC, Canada
Abstract
In this work a numerical technique for calculating the influence of diffraction of an electromagnetic wave by a boundary in an optical system within a ray-tracing environment is presented. The technique was inspired by the theory of Boundary Diffraction Waves applied at circular apertures. The numerical technique presented here is intended to analyze diffraction of a wavefront at a circular aperture within an optical system, but not restricted to being the aperture stop. At the diffractive aperture discrete sampling of the wavefront permits the selection of a geometrical wave and separates this wave from an assumed boundary wave that will direct luminous energy from the incident wave into the geometrical shadow. Sampling requirements are also discussed since three sampling periods need to coexist. A pseudo-random sampling technique is applied to sample the diffracted rays in order to reduce aliasing in the final irradiance distribution. The technique is incorporated into a traditional ray tracing environment to allow future generalization of the technique. Two cases were simulated. First the far-field diffraction due to a circular aperture was simulated. The results were close to the analytical solution of diffraction by a circular aperture in the Fraunhofer region. The comparison was feasible in a ray-tracing environment due to the incorporation of perfect imaging lens that acted as a phase element in that appropriate phase correction was introduced. Finally a thick bi-convex lens was simulated such that the aperture was placed before the bi-convex lens.
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A. Cifuentes, A. Cifuentes, J. Arasa, J. Arasa, C. Pizarro, C. Pizarro, } "Forward tracing technique for diffraction analysis of apertures in optical systems", Proc. SPIE 6342, International Optical Design Conference 2006, 63420K (24 July 2006); doi: 10.1117/12.692245; https://doi.org/10.1117/12.692245
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