Paper
13 July 2006 High-precision measurements of reflectance
Philippe Voarino, Sébastien Petitrenaud, Hervé Piombini, Frédéric Sabary, Daniel Marteau
Author Affiliations +
Proceedings Volume 6342, International Optical Design Conference 2006; 63421Z (2006) https://doi.org/10.1117/12.692235
Event: International Optical Design Conference 2006, 2006, Vancouver, BC, Canada
Abstract
The reflector's specifications of amplifying section of LMJ need to have spectral high-precision reflectance measurements. The innovative solution proposes to increase the precision of reflectance measurements, and to enable measure of pieces in form like spherical mirrors. This activity has been beginning for months and improvements have been performed.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Philippe Voarino, Sébastien Petitrenaud, Hervé Piombini, Frédéric Sabary, and Daniel Marteau "High-precision measurements of reflectance", Proc. SPIE 6342, International Optical Design Conference 2006, 63421Z (13 July 2006); https://doi.org/10.1117/12.692235
Lens.org Logo
CITATIONS
Cited by 8 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Mirrors

Reflection

Reflectors

Sensors

Reflectivity

Spectrophotometry

Monochromators

Back to Top