12 October 2006 Temperature compensation of step recovery diode in fast sampling circuits
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Proceedings Volume 6347, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006; 63472G (2006) https://doi.org/10.1117/12.714693
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006, 2006, Wilga, Poland
Abstract
The paper concerns temperature compensation of time delay in ultra fast sampling circuits, used in digital oscilloscopes of gigahertz bandwidth. The main source of thermal instability appears to be step recovery diode used for sampling pulses generation, so the effort was taken toward assuring invariance of its delay regardless of operating temperature. The idea was successfully tested in the proposed circuit for diode polarisation and compensation.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Aleksander Burd, Aleksander Burd, Katarzyna Opalska, Katarzyna Opalska, "Temperature compensation of step recovery diode in fast sampling circuits", Proc. SPIE 6347, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2006, 63472G (12 October 2006); doi: 10.1117/12.714693; https://doi.org/10.1117/12.714693
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