Translator Disclaimer
20 October 2006 The structure and phase composition of Co/Cu bilayers: sensing elements for magnetoresistive application
Author Affiliations +
Proceedings Volume 6348, Optoelectronic and Electronic Sensors VI; 63480A (2006) https://doi.org/10.1117/12.721042
Event: Optoelectronic and Electronic Sensors VI, 2006, Zakopane, Poland
Abstract
Experiments were carried out on single films of Co and Cu, and on Co-Cu bilayers evaporated on the NaCl(001) substrates at room temperature. A thickness of single films, measured by interferometry method, has been changed from 3 to 40 nm for Cu and from 5 to 40 nm for Co. The Transmission Electron Microscope studies showed that at annealing temperatures below 600 K the films consist of fcc Cu and hcp Co. After annealing at higher temperatures, besides the presence of phases already observed at lower temperatures, also Co-Cu solid solution together with single phase of hcp Co was observed.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Konstanty Marszałek, Marta Marszałek, Sergey Protsenko, and Anatoliy Chornous "The structure and phase composition of Co/Cu bilayers: sensing elements for magnetoresistive application", Proc. SPIE 6348, Optoelectronic and Electronic Sensors VI, 63480A (20 October 2006); https://doi.org/10.1117/12.721042
PROCEEDINGS
4 PAGES


SHARE
Advertisement
Advertisement
Back to Top