Paper
20 October 2006 Verification of multiband system for noncontact emissivity measurements
Author Affiliations +
Proceedings Volume 6348, Optoelectronic and Electronic Sensors VI; 63480L (2006) https://doi.org/10.1117/12.721028
Event: Optoelectronic and Electronic Sensors VI, 2006, Zakopane, Poland
Abstract
In recent years an increasing interest in passive multiband systems for temperature and emissivity measurement was noted. However, available literature about passive multiband systems concentrated exclusively on problem of temperature measurements with these systems in situation when these systems can be also used for non-contact emissivity measurements. Modeling of such systems, what is usually the first stage of system designing, requires acceptation of several simplifications and approximations. In this paper an experimental verification of modeling results is performed based on developed measurement setup. Obtained results are in good agreement with results of previously performed computer analyses that shows usefulness of multiband method for emissivity measurements in working conditions.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Adam Mazikowski "Verification of multiband system for noncontact emissivity measurements", Proc. SPIE 6348, Optoelectronic and Electronic Sensors VI, 63480L (20 October 2006); https://doi.org/10.1117/12.721028
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KEYWORDS
Temperature metrology

Black bodies

Calibration

Systems modeling

Copper

Head

Optical filters

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