Paper
26 March 1986 Automatic Pattern Recognition System With Self-Learning Algorithm Based On Feature Template Matching
Masato Nakashima, Tetsuo Koezuka, Noriyuki Hiraoka, Takefumi Inagaki
Author Affiliations +
Proceedings Volume 0635, Applications of Artificial Intelligence III; (1986) https://doi.org/10.1117/12.964164
Event: 1986 Technical Symposium Southeast, 1986, Orlando, United States
Abstract
A new self-learning technique has been developed to increase recognition efficiency and improve operability of an automatic pattern recognition system. The new algorithm can automatically make feature templates that emphasize the difference between similar patterns. This algorithm compares all the templates with each other by cross-correlating and picks out similar pattern pairs. The differences between similar patterns are extracted as the feature templates. This system can automatically carry out this procedure for 100 template patterns in 5 minutes.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Masato Nakashima, Tetsuo Koezuka, Noriyuki Hiraoka, and Takefumi Inagaki "Automatic Pattern Recognition System With Self-Learning Algorithm Based On Feature Template Matching", Proc. SPIE 0635, Applications of Artificial Intelligence III, (26 March 1986); https://doi.org/10.1117/12.964164
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Detection and tracking algorithms

Pattern recognition

Evolutionary algorithms

Artificial intelligence

Feature extraction

Image processing

Optical character recognition

Back to Top