Paper
26 March 1986 Expert Measurement System For Ultrasonically Characterizing Material Properties
Richard K. Elsley, Ming-Shong Lan
Author Affiliations +
Proceedings Volume 0635, Applications of Artificial Intelligence III; (1986) https://doi.org/10.1117/12.964121
Event: 1986 Technical Symposium Southeast, 1986, Orlando, United States
Abstract
When a human expert performs laboratory measurements, he uses a number of evaluation and decision making techniques that are not usually included in automated measurement systems. These include method selection, method discovery and heuristic evaluation of data and results. This paper describes a preliminary Expert Measurement System that adds these expert thought processes to conventional automated measurements. This Expert Measurement System is the Material Characterization Expert System (MCES). It measures physical properties of materials by the use of ultrasonic waves. Its performance is close to that of a human expert and it operates much more quickly.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Richard K. Elsley and Ming-Shong Lan "Expert Measurement System For Ultrasonically Characterizing Material Properties", Proc. SPIE 0635, Applications of Artificial Intelligence III, (26 March 1986); https://doi.org/10.1117/12.964121
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KEYWORDS
Ultrasonics

Signal processing

Data acquisition

Transducers

Signal attenuation

Velocity measurements

Feature extraction

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