PROCEEDINGS VOLUME 6357
SIXTH INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION AND CONTROL TECHNOLOGY | 13-15 OCTOBER 2006
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence
Editor(s): Jiancheng Fang, Zhongyu Wang
Editor Affiliations +
SIXTH INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION AND CONTROL TECHNOLOGY
13-15 October 2006
Beijing, China
Signal Acquisition, Processing, and Analysis
Chunyan Nie, Yaowu Shi, Zhuwen Wang, Bin Guo
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635701 (2006) https://doi.org/10.1117/12.716671
Xueyan Li, Shuxu Guo, Ye Li
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635702 (2006) https://doi.org/10.1117/12.716674
Quanwei Wang, Xueyi Li, Dong Li
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635703 (2006) https://doi.org/10.1117/12.716676
Tangren Dan, Zhenxing Wang, Xin Du, Yan Liu, Tianhui Ding
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635704 (2006) https://doi.org/10.1117/12.716678
Chengxiang Liu, Xuejuan Hu, Yaobo Jian, Li Zhang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635705 (2006) https://doi.org/10.1117/12.716687
Renxiao Qiao, Xiaofeng Meng, Yingying Wang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635706 (2006) https://doi.org/10.1117/12.716688
Feiyu Huang, Hongjie Yuan, Chuanri Li
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635707 (2006) https://doi.org/10.1117/12.716689
Qiuhua Du, Shunian Yang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635708 (2006) https://doi.org/10.1117/12.716691
Yan Zhang, Hong-Yan Dong, Zhen-Kang Shen
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635709 (2006) https://doi.org/10.1117/12.716694
Zhengxiang Qian, Luyi Yang, Wei Chen, Penghui Ding
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570A (2006) https://doi.org/10.1117/12.716695
Junjie Zheng, Xiaoke Yan, Caicheng Shi
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570B (2006) https://doi.org/10.1117/12.716697
Jie Jiang, Bo Lv, Guangjun Zhang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570C (2006) https://doi.org/10.1117/12.716698
Cuifang Zhao, Caicheng Shi, Peikun He
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570D (2006) https://doi.org/10.1117/12.716728
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570E (2006) https://doi.org/10.1117/12.716735
Mingzhao Zhang, Boxiong Wang, Xiuzhi Luo, Chao Yu, Baiqing Hu
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570F (2006) https://doi.org/10.1117/12.716737
Yajie Wang, Xinhe Xu
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570G (2006) https://doi.org/10.1117/12.716740
Ji-qiang Tang, Jian-cheng Fang, Yan-shun Zhang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570H (2006) https://doi.org/10.1117/12.716743
Hong-min Li, Yi-gang He
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570I (2006) https://doi.org/10.1117/12.716902
Peng Ding, Qi Shuang Ma, Chang You Li, Hong Yu Yao
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570J (2006) https://doi.org/10.1117/12.716903
Changyou Li, Hongyu Yao, Qishuang Ma
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570K (2006) https://doi.org/10.1117/12.716736
Wei Zheng, Liyong Zhang, Sijiu Liu, Zhiguo Yu
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570L (2006) https://doi.org/10.1117/12.716741
Hao Yu, Shuangyun Shao, Zhifeng Zhang, Qibo Feng
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570M (2006) https://doi.org/10.1117/12.716744
Lanzhou Wang, Qiao Li, Dongsheng Li, Zhijuan Ma, Haixia Li, Yuan Jiang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570N (2006) https://doi.org/10.1117/12.716745
Jiuqing Wan, Jinsong Yu, Xingshan Li
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570O (2006) https://doi.org/10.1117/12.716747
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570P (2006) https://doi.org/10.1117/12.716749
Chi Zhang, Zheng You, Shijie Yu
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570Q (2006) https://doi.org/10.1117/12.716772
Wei Wang, Peide Feng
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570R (2006) https://doi.org/10.1117/12.716773
Feng Xue, Zhong Liu, Zhangsong Shi
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570S (2006) https://doi.org/10.1117/12.716774
Qingbo Li, Xiang Li, Guangjun Zhang, Kexin Xu, Yan Wang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570T (2006) https://doi.org/10.1117/12.716898
Xiaohua Wang, Yigang He, Shaosheng Fan, Hong Li
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570U (2006) https://doi.org/10.1117/12.716901
Haihong Hu, Jimin Liang, Heng Zhao, Yanbin Hou
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570V (2006) https://doi.org/10.1117/12.716905
Xudong Li, Xiaohao Wang, Qiang Li, Huijie Zhao
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570W (2006) https://doi.org/10.1117/12.716906
Duanhui Duan, Qiusheng Wang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570X (2006) https://doi.org/10.1117/12.716909
Yincheng Qi, Jinsha Yuan, Jingxi Zhang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570Y (2006) https://doi.org/10.1117/12.716910
Jun Feng, Yanhai Zhu
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63570Z (2006) https://doi.org/10.1117/12.716914
Qiufeng Shang, Yincheng Qi
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635710 (2006) https://doi.org/10.1117/12.716916
Yunxia Bao, Peikun He, Erke Mao
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635711 (2006) https://doi.org/10.1117/12.716917
Jin Li, Hong Yu, Lulu Zhou, Hong Liang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635712 (2006) https://doi.org/10.1117/12.716926
Yuchen Sun, Baozhen Ge
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635713 (2006) https://doi.org/10.1117/12.716928
Tingyang Yan, Chunxi Zhang, Shuang Gao, Zongfeng Ma
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635714 (2006) https://doi.org/10.1117/12.716938
Yongchuan Wang, Zili Chen
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635715 (2006) https://doi.org/10.1117/12.716941
Hui Ding, Mengyin Fu
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635716 (2006) https://doi.org/10.1117/12.716942
Xiaoguang Chen, Jiancheng Fang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635717 (2006) https://doi.org/10.1117/12.716950
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635718 (2006) https://doi.org/10.1117/12.716952
Fuming Wang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635719 (2006) https://doi.org/10.1117/12.716957
Shunliang Pan, Xiaojian Wang, Weiqun Shen, Zishan Song
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571A (2006) https://doi.org/10.1117/12.716958
Zilu Ying, Jingwen Li, Youwei Zhang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571B (2006) https://doi.org/10.1117/12.716969
Shuangdong Zhu, Tiantian Jiang, Lanlan Liu
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571C (2006) https://doi.org/10.1117/12.716971
Jun Wang, Naiguang Lu, Wenyi Deng, Mingli Dong
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571D (2006) https://doi.org/10.1117/12.716972
Chunsheng Liu, Xingliang Yin, Tianxu Zhang, Shitao Deng, Xiaotong Li
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571E (2006) https://doi.org/10.1117/12.716974
Zhao Jian, Zhao Yan
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571F (2006) https://doi.org/10.1117/12.716978
Jianhui Zhao, Yanliang Xu
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571G (2006) https://doi.org/10.1117/12.716927
Xiaoxiao Yi, Yan Zhao
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571H (2006) https://doi.org/10.1117/12.716946
Chris Guy
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571I (2006) https://doi.org/10.1117/12.716964
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571J (2006) https://doi.org/10.1117/12.716966
Horst Grotstollen
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571K (2006) https://doi.org/10.1117/12.716967
Hideki Aoyama, Yoshiharu Azuma, Sachiko Goto, Tetsuhiro Sumimoto
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571L (2006) https://doi.org/10.1117/12.716968
Akira Ikuta
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571M (2006) https://doi.org/10.1117/12.716982
T. Sumimoto, T. Maruyama, Y. Azuma, S. Goto, M. Mondou, N. Furukawa, S. Okada
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571N (2006) https://doi.org/10.1117/12.716986
Yegui Xiao, Liying Ma, Akira Ikuta
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571O (2006) https://doi.org/10.1117/12.716991
Yessy Arvelyna, Masaki Oshima, Tetsuhiro Sumimoto
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571P (2006) https://doi.org/10.1117/12.716993
Yoshifumi Fujita, Mitsuo Ohta
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571Q (2006) https://doi.org/10.1117/12.716995
Sachiko Goto, Yoshiharu Azuma, Hideki Aoyama, Tetsuhiro Sumimoto
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571R (2006) https://doi.org/10.1117/12.716998
Takao Nakamura, Toshimasa Kusuhara, Yoshitake Yamamoto
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571S (2006) https://doi.org/10.1117/12.717000
Yuri V. Chugui, Vladimir S. Bazin, Leonid V. Finogenov, Sergei N. Makarov, Alexander G. Verkhogliad
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571T (2006) https://doi.org/10.1117/12.717007
Measurement Theory and Technology
Guijun Gao, Ziming Kou
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571U (2006) https://doi.org/10.1117/12.716983
Dandan Zhu, Zhiquan Li, Yan Li, Yaping Li, Zhongchao Li
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571V (2006) https://doi.org/10.1117/12.716985
Chuangwen Xu, Hualing Cheng, Baodong Li
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571W (2006) https://doi.org/10.1117/12.716988
Hui Yu, Yuzhen Cao, Lixin Zhang, Mingshi Ding
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571X (2006) https://doi.org/10.1117/12.716990
Wei Zhang, Zhigang Li
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571Y (2006) https://doi.org/10.1117/12.716992
Huachao Yang, Shubi Zhang, Guangli Guo, Chao Liu, Ruipeng Yu
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63571Z (2006) https://doi.org/10.1117/12.717096
Miao Cao, Zhiyong An, Ying Zhang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635720 (2006) https://doi.org/10.1117/12.717098
Bo Li, Daqing Huang, Riurui Nie
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635721 (2006) https://doi.org/10.1117/12.717103
Jiyan Zhang, Liru Wang, Zhenya Ma
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635722 (2006) https://doi.org/10.1117/12.717110
Zi Xue, Xiaoyou Ye
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635723 (2006) https://doi.org/10.1117/12.717111
Xin Tang, Xiangjun Zeng, Chunming Tu
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635724 (2006) https://doi.org/10.1117/12.717112
Zhongbao Xu, Nan Zhang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635725 (2006) https://doi.org/10.1117/12.717115
Qiang Zhou, Fengxin Yu, Shouqian Yu
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635726 (2006) https://doi.org/10.1117/12.717122
Shumin Zhou, Yamin Sun, Ling Lu, Yongping Gao
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635727 (2006) https://doi.org/10.1117/12.717125
Sheng Zhao, Shan Chen
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635728 (2006) https://doi.org/10.1117/12.717135
Chao Yu, Boxiong Wang, Hanqing Zheng, Xiuzhi Luo, Mingzhao Zhang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635729 (2006) https://doi.org/10.1117/12.717140
Jungong Ma, Haitao Wang, Naotake Oneyama, Mitsuru Senoo, Huping Zhang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572A (2006) https://doi.org/10.1117/12.717144
Jie Xie, Bo Yang, Qiang He
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572B (2006) https://doi.org/10.1117/12.717152
Fengli Gao, Shuxu Guo, Bibo Lu, Junsheng Cao, Shuang Zhang, Ke Wei
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572C (2006) https://doi.org/10.1117/12.717154
Yingzhong Tian, Ming Li, Wei Li, Zhiliang Yao, Minglun Fang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572D (2006) https://doi.org/10.1117/12.717156
Xiaojun Liu, Yi Huang, Kun Liu, Changlin Gui
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572E (2006) https://doi.org/10.1117/12.717117
Zheng Qian, Shufen Teng
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572F (2006) https://doi.org/10.1117/12.717120
Zheng Qian, Dan Yu
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572G (2006) https://doi.org/10.1117/12.717121
Liru Wang, Qingrong Zhang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572H (2006) https://doi.org/10.1117/12.717123
Mingfu Zhao, Liang Li, Yu Dong, Chun Dong
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572I (2006) https://doi.org/10.1117/12.717127
Liwen Yan, Tao Yu, Meiting Wan
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572J (2006) https://doi.org/10.1117/12.717128
Xinmeng Liu, Xiyuan Peng, Hui Huang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572K (2006) https://doi.org/10.1117/12.717129
Xintao Xia, Xiaoyang Chen, Zhongyu Wang, Yongzhen Zhang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572L (2006) https://doi.org/10.1117/12.717137
Xintao Xia, Xiaoyang Chen, Zhongyu Wang, Yongzhen Zhang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572M (2006) https://doi.org/10.1117/12.717139
Hongkun He, Haoshan Shi
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572N (2006) https://doi.org/10.1117/12.717143
Yiding Zhao, Shuhua Ma
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572O (2006) https://doi.org/10.1117/12.717145
Fuxian Zhou, Yuxing Li, Huimin Yang, Jian Zhang, Shouping Dong
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572P (2006) https://doi.org/10.1117/12.717134
Shangchun Fan, Yijun Wang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572Q (2006) https://doi.org/10.1117/12.717136
Shi Zhang, Xiaonan Jia, Shuai Shang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572R (2006) https://doi.org/10.1117/12.717138
Yingyang Yu, Hongjie Yuan, Tongmin Jiang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572S (2006) https://doi.org/10.1117/12.717141
Shuang Gao, Chunxi Zhang, Tingyang Yan, Chen Li
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572T (2006) https://doi.org/10.1117/12.717147
Shaosheng Fan, Xiaohua Wang, Hong Li
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572U (2006) https://doi.org/10.1117/12.717148
Qiying Kong, Jianhui Zhao, Fan Li
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572V (2006) https://doi.org/10.1117/12.717149
Ying Hu, Jin Huang, Zi Ma
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572W (2006) https://doi.org/10.1117/12.717151
Junkui Wang, Bo Yang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572X (2006) https://doi.org/10.1117/12.717157
Yu Lin, Jie Yang, Jun Tang
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572Y (2006) https://doi.org/10.1117/12.717158
Yanqin Lin, Xu Liu, Song Chen, Zhong Chen
Proceedings Volume Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572Z (2006) https://doi.org/10.1117/12.717160