24 October 2006 Denoising of electrical derivative data of semiconductor lasers based on nonlinear diffusion equation
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Proceedings Volume 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence; 63572C (2006); doi: 10.1117/12.717154
Event: Sixth International Symposium on Instrumentation and Control Technology, 2006, Beijing, China
Abstract
The method of screening semiconductor lasers by using electrical derivative technique is described in detail. The nonlinear diffusion equation is applied to denoising of electrical derivative data according to its denoising theory in signal processing. The denoising experiments of electrical derivative data for several dozens semiconductor lasers indicate that the denoising method can effectively reduce the noise in electrical derivative data and the errors of the measured parameters. The farther experiments indicate that the accurate estimate ratio of the devices can be effectively increased by using the measured parameters which have been denoised, to estimate the quality and reliability of semiconductor lasers.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fengli Gao, Shuxu Guo, Bibo Lu, Junsheng Cao, Shuang Zhang, Ke Wei, "Denoising of electrical derivative data of semiconductor lasers based on nonlinear diffusion equation", Proc. SPIE 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572C (24 October 2006); doi: 10.1117/12.717154; https://doi.org/10.1117/12.717154
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KEYWORDS
Denoising

Diffusion

Semiconductor lasers

Reliability

Signal processing

Nonlinear optics

Error analysis

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