Translator Disclaimer
28 October 2006 Boundary-scan test system based on VXI bus
Author Affiliations +
The boundary-scan technology is widely proposed as the main test method in coping with the growing complexity of Multi-chip modules (MCM) and PCBs. In this paper, the IEEE 1149.1 standard and the IEEE 1149.5 standard are introduced. The whole architecture and the relevant module design of the VXI boundary-scan test system are discussed. The test software compatible with the Boundary-scan Description Language (BSDL) files and the netlist files are developed under LabWindows/CVI. The test items of the system are introduced briefly. The actual test is performed on a multi-chip module.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ying Du, Wenyan Zhao, and Quansheng Xi "Boundary-scan test system based on VXI bus", Proc. SPIE 6358, Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation, 63581P (28 October 2006);


Use Of A Rule-Based System For Process Control
Proceedings of SPIE (October 19 1987)
A digital control system of brushless DC motor based on...
Proceedings of SPIE (November 06 2006)
GaAs VLSI technology and circuit elements for DSP
Proceedings of SPIE (October 01 1990)
Electron Beam Testing And Its Applications To VLSI Technology
Proceedings of SPIE (February 02 1988)
Built-in self-test for high-speed integrated circuits
Proceedings of SPIE (September 12 1996)

Back to Top