Software design of missile integrated test system

Jing Dai; Ping Zhang; Xingshan Li; Canxing Liao; Zongli Wang

doi:10.1117/12.718066

30 October 2006 Software design of missile integrated test system

Jing Dai, Ping Zhang, Xingshan Li, Canxing Liao, Zongli Wang

Proceedings Volume 6358, Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation; 63583J (2006) https://doi.org/10.1117/12.718066
Event: Sixth International Symposium on Instrumentation and Control Technology, 2006, Beijing, China

Abstract

Based on virtual instrument, software design precept of missile integrated test system is proposed in this paper. The integrated test system software was developed under modular, intelligent and structured precept. In this way, the expansion capability of the test software is improved, and it is very convenient for second-development and maintenance. This test software is of higher-degree automation, its integrated test environment gives full play to the hardware platform of the missile integrated test system. In response to the specific hardware configuration of the test system and special missile test requirements, the application of test resources was optimized in the test procedure to improve test speed greatly and satisfy the power-on time limit for missile test. At the same time, by applying multithreading and hardware clock on a data acquisition card, accurate data acquisition, data calculating and data injecting can be completed in a millisecond to satisfy the harsh missile test requirement. This automatic test equipment can automatically test the nose cabin and control cabin only of a missile and a training missile; all the missile test items can be accomplished in a short period of time to enhance the efficiency and reliability of the test.

Citation Download Citation

Jing Dai, Ping Zhang, Xingshan Li, Canxing Liao, and Zongli Wang "Software design of missile integrated test system", Proc. SPIE 6358, Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation, 63583J (30 October 2006); https://doi.org/10.1117/12.718066

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available