Paper
13 October 2006 Optimal tolerance allocation in the optical head of near-field recording system
Jun-Hee Lee, Hyoung-Kil Yoon, Jaehwa Jeong, Dae-Gab Gweon, Wan-Doo Kim
Author Affiliations +
Proceedings Volume 6368, Optoelectronic Devices: Physics, Fabrication, and Application III; 636811 (2006) https://doi.org/10.1117/12.685709
Event: Optics East 2006, 2006, Boston, Massachusetts, United States
Abstract
In this paper, error analysis and tolerance allocation methods for the optical head of NFR (Near Field Recording) system are presented. We fabricate the NFR system and test the reading & writing performance of the NFR system. The test results show that the performance is not good enough. In order to find the cause of the performance drop in the NFR system, assembly and manufacturing tolerances in the optical head of NFR system are simulated. The tolerances analysis result shows that it needs to allocate the tolerances of the optical head of NFR system. So we proposed optimal compound tolerance allocation method using WOW (worst on worst) method and Monte-Carlo method base on sensitive analysis of the optical system. We used two tolerance allocation methods to allocate the compound tolerance in the optical head of NFR system. The results show that WOW method is an over-design method and the Monte-Carlo method is the optimal method of tolerance allocation in optical system.
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Jun-Hee Lee, Hyoung-Kil Yoon, Jaehwa Jeong, Dae-Gab Gweon, and Wan-Doo Kim "Optimal tolerance allocation in the optical head of near-field recording system", Proc. SPIE 6368, Optoelectronic Devices: Physics, Fabrication, and Application III, 636811 (13 October 2006); https://doi.org/10.1117/12.685709
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KEYWORDS
Tolerancing

Near field optics

Wavefronts

Assembly tolerances

Head

Monte Carlo methods

Error analysis

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