19 October 2006 A modified high-resolution TEM for thermoelectric properties measurements of nanowires and nanotubes
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Abstract
Nanowires are interesting candidates for thermoelectric applications because of their potentially low thermal conductivity and high power factor. However, measurements at the single-wire level are challenging and tend to lack detailed information about the atomic-level structure of the sample and contacts. We are modifying a high-resolution transmission electron microscope (HRTEM) with integrated scanning tunneling microscope (STM) for in-situ measurements of the thermoelectric properties of individual nanowires and nanotubes. A slender hot-wire probe is used to make electrical and thermal contact to the free end of a nanowire or nanotube. The electrical conductance of the nanowire/nanotube can be measured with the usual STM mode of operation. The Seebeck coefficient can be extracted from the transient response to a step change in the joule heating of the hot-wire probe. The thermal conductance can be calculated from the temperature and heat leakage of the hot-wire probe. These measurements are combined with detailed HRTEM observations.
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C. Dames, C. Dames, S. Chen, S. Chen, C. T. Harris, C. T. Harris, J. Y. Huang, J. Y. Huang, Z. F. Ren, Z. F. Ren, M. S. Dresselhaus, M. S. Dresselhaus, G. Chen, G. Chen, } "A modified high-resolution TEM for thermoelectric properties measurements of nanowires and nanotubes", Proc. SPIE 6370, Nanomaterial Synthesis and Integration for Sensors, Electronics, Photonics, and Electro-Optics, 63700E (19 October 2006); doi: 10.1117/12.689422; https://doi.org/10.1117/12.689422
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