20 October 2006 Optical crack following on tunnel surfaces
Author Affiliations +
Proceedings Volume 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV; 638207 (2006) https://doi.org/10.1117/12.685987
Event: Optics East 2006, 2006, Boston, Massachusetts, United States
Abstract
One of the most important monitoring tasks of tunnel inspection is the observation of cracks. This paper describes an approach for crack following using mid-resolution (2-5mm per pixel) images of the tunnel surface. A mosaic on the basis of the tunnel design surface is built from images taken with a mobile platform. On this image representing the unwrapped tunnel surface texture the starting points of each crack are found semiautomatically using a modified Hough transform. Crack following takes place on the basis of local line fitting and exhaustive search in both directions of the crack, taking into account several restrictions, rules and optimization criteria to find the correct crack trajectory. A practical implementation polygonizes the extracted cracks and feeds them into a tunnel inspection data base. The method is applicable to various types of background texture as expected in the tunnel environment.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gerhard Paar, Gerhard Paar, Maria d. P. Caballo-Perucha, Maria d. P. Caballo-Perucha, Heiner Kontrus, Heiner Kontrus, Oliver Sidla, Oliver Sidla, } "Optical crack following on tunnel surfaces", Proc. SPIE 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV, 638207 (20 October 2006); doi: 10.1117/12.685987; https://doi.org/10.1117/12.685987
PROCEEDINGS
8 PAGES


SHARE
RELATED CONTENT

Analysis of light strip images on cutting tools to extract...
Proceedings of SPIE (September 21 1994)
Three Dimensional Perception For Robot Vision
Proceedings of SPIE (December 13 1983)
Real-time stereo for industrial inspection
Proceedings of SPIE (May 03 2004)
3D model matching for fine pose determination
Proceedings of SPIE (October 03 1995)

Back to Top