Paper
19 May 2007 Characterization of atomic coherence decay for storage of light experiments
E. Figueroa, F. Vewinger, J. Appel, G. Günter, A. I. Lvovsky
Author Affiliations +
Proceedings Volume 6422, Sixth Symposium Optics in Industry; 64221T (2007) https://doi.org/10.1117/12.742560
Event: Sixth Symposium Optics in Industry, 2007, Monterrey, Mexico
Abstract
We report characterization of EIT resonances in the D1 line of Rb 87 under various experimental conditions. The dependence of the EIT linewidth on the power of the control field investigated. Strictly linear behavior between the ground levels as the main source of decoherence. We therefore formulated a new theory assuming pure dephasing to be the main decoherence mechanism. We also performed experiments where we created additional decoherence mechanisms by means of a counter-propagating repumper field. This field caused the ground-state population exchange, thus reproducing conditions in which the original theory is valid.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. Figueroa, F. Vewinger, J. Appel, G. Günter, and A. I. Lvovsky "Characterization of atomic coherence decay for storage of light experiments", Proc. SPIE 6422, Sixth Symposium Optics in Industry, 64221T (19 May 2007); https://doi.org/10.1117/12.742560
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KEYWORDS
Electroluminescent displays

Rubidium

Semiconductor lasers

Chemical species

Bragg cells

Doppler effect

Polarization

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