14 February 2007 Calibration of a phase-shifting DIC microscope for quantitative phase imaging
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Abstract
Phase-shifting differential interference contrast (DIC) provides images in which the intensity of DIC is transformed into values linearly proportional to differential phase delay. Linear regression analysis of the Fourier space, spiral phase, integration technique shows these values can be integrated and calibrated to provide accurate phase measurements of objects embedded in optically transparent media regardless of symmetry or absorption properties. This approach has the potential to overcome the limitations of profilometery, which cannot access embedded objects, and extend the capabilities of the traditional DIC microscope, which images embedded phase objects, but does not provide quantitative information.
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Sharon V. King, Ariel R. Libertun, Chrysanthe Preza, Carol J. Cogswell, "Calibration of a phase-shifting DIC microscope for quantitative phase imaging", Proc. SPIE 6443, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIV, 64430M (14 February 2007); doi: 10.1117/12.725061; https://doi.org/10.1117/12.725061
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