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20 February 2007 Concentration dependence of the fluorescence decay profile in transition metal doped chalcogenide glass
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Abstract
In this paper we present the fluorescence decay profiles of vanadium and titanium doped gallium lanthanum sulphide (GLS) glass at various doping concentrations between 0.01 and 1% (molar). We demonstrate that below a critical doping concentration the fluorescence decay profile can be fitted with the stretched exponential function: exp[-(t/&tgr;)&bgr;], where &tgr; is the fluorescence lifetime and &bgr; is the stretch factor. At low concentrations the lifetime for vanadium and titanium doped GLS was 30 &mgr;s and 67 &mgr;s respectively. We validate the use of the stretched exponential model and discuss the possible microscopic phenomenon it arises from. We also demonstrate that above a critical doping concentration of around 0.1% (molar) the fluorescence decay profile can be fitted with the double exponential function: a*exp-(t/&tgr;1)+ b*exp-(t/&tgr;2), where &tgr;1 and &tgr;2 are characteristic fast and slow components of the fluorescence decay profile, for vanadium the fast and slow components are 5 &mgr;s and 30 &mgr;s respectively and for titanium they are 15 &mgr;s and 67 &mgr;s respectively. We also show that the fluorescence lifetime of vanadium and titanium at low concentrations in the oxide rich host gallium lanthanum oxy-sulphide (GLSO) is 43 &mgr;s and 97 &mgr;s respectively, which is longer than that in GLS. From this we deduce that vanadium and titanium fluorescing ions preferentially substitute into high efficiency oxide sites until at a critical concentration they become saturated and low efficiency sulphide sites start to be filled.
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M. Hughes, D. W. Hewak, and R. J. Curry "Concentration dependence of the fluorescence decay profile in transition metal doped chalcogenide glass", Proc. SPIE 6469, Optical Components and Materials IV, 64690D (20 February 2007); https://doi.org/10.1117/12.699134
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