Regression models are developed for lifetime prediction of diode lasers with increasing or decreasing
operating current in the gradual degradation stage of their lifetime. Programmable expressions for laser lifetime
extrapolation are presented. Analytical results are explicated by case examples based on measured data from
reliability tests of commercially available 10mW and 650nm wavelength InGaAlP lasers conducted under
accelerated ageing conditions.
"Lifetime prediction of diode lasers with different ageing behavior", Proc. SPIE 6485, Novel In-Plane Semiconductor Lasers VI, 648519 (27 February 2007); doi: 10.1117/12.713935; https://doi.org/10.1117/12.713935