13 February 2007 Prediction of intensity and color degradation of LEDs
Author Affiliations +
Abstract
In this paper, a current-accelerated method for fast estimation of the intensity and color degradation with corresponding variability of light-emitting diodes (LEDs) is presented. The method is based on automated periodical spectral measurements of emitted light of LEDs under different current loads, which include nominal and several different above nominal currents. The intensity and color degradation and corresponding variability among different LEDs at a specified current are estimated by detailed analysis of the acquired spectral data at above nominal currents. The method was validated by comparing the predicted values with the measured values at nominal current. The proposed method was tested on white LEDs (luminous intensity ranged from 5 to 20 cd) from five manufacturers (Nichia, Etgtech, Sansen, Daina, and Velleman). The results show that the intensity and color degradation and corresponding variability among different LEDs is significant and, therefore, should be considered with great care when designing highly demanding lighting products.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Miran Bürmen, Miran Bürmen, Franjo Pernuš, Franjo Pernuš, Boštjan Likar, Boštjan Likar, } "Prediction of intensity and color degradation of LEDs", Proc. SPIE 6486, Light-Emitting Diodes: Research, Manufacturing, and Applications XI, 64860M (13 February 2007); doi: 10.1117/12.698987; https://doi.org/10.1117/12.698987
PROCEEDINGS
10 PAGES


SHARE
RELATED CONTENT

Full-field wafer warpage measurement technique
Proceedings of SPIE (June 26 2017)
Technology and design
Proceedings of SPIE (February 16 2005)
Maximizing useful SSL lifetime
Proceedings of SPIE (January 26 2004)
Dirty LED effect of dust, fat, fingerprints, water, oil...
Proceedings of SPIE (February 11 2010)

Back to Top