20 February 2007 Bad pixel location algorithm for cell phone cameras
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As CMOS imaging technology advances, sensor to sensor differences increase, creating an increasing need for individual, per sensor, calibration. Traditionally, the cell-phone market has a low tolerance for complex per unit calibration. This paper proposes an algorithm that eliminates the need for a complex test environment and does not require a manufacturing based calibration on a per phone basis. The algorithm locates "bad pixels", pixels with light response characteristics out of the mean range of the values specified by the manufacturer in terms of light response. It uses several images captured from a sensor without using a mechanical shutter or predefined scenes. The implementation that follows uses two blocks: a dynamic detection block (local area based) and a static correction block (location table based). The dynamic block fills the location table of the static block using clustering techniques. The result of the algorithm is a list of coordinates containing the location of the found 'bad pixels'. An example is given of how this method can be applied to several different cell-phone CMOS sensors.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sergio Goma, Sergio Goma, Milivoje Aleksic, Milivoje Aleksic, } "Bad pixel location algorithm for cell phone cameras", Proc. SPIE 6502, Digital Photography III, 65020H (20 February 2007); doi: 10.1117/12.702955; https://doi.org/10.1117/12.702955


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