22 March 2007 Evaluation of Moire artifacts with stationary anti-scatter grids in amorphous selenium-based flat panel x-ray detector system
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Abstract
In digital imaging systems, using anti-scatter grids may lead to arise moire artifacts. Recently, amorphous seleniumbased (direct-conversion) flat panel X-ray detector systems were developed. An important advantage of a-Se is its high spatial resolution. However, the high resolution of a-Se potentially introduces more moire artifacts.1 The aim of present study was to choice optimal anti-scatter grids in amorphous selenium-based flat panel X-ray system, and to demonstrate how to arise moire artifacts. We simulated the sampling process in the spatial domain equivalent to the sampling aperture function in the spatial frequency domain. Moire patterns appeared with the different period and contrast. The period and the contrast of moire artifacts were varied with combinations of the sampling conditions and the strip density of antiscatter grids.
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K. Oda, K. Oda, M. Tsuzaka, M. Tsuzaka, } "Evaluation of Moire artifacts with stationary anti-scatter grids in amorphous selenium-based flat panel x-ray detector system", Proc. SPIE 6510, Medical Imaging 2007: Physics of Medical Imaging, 651040 (22 March 2007); doi: 10.1117/12.710639; https://doi.org/10.1117/12.710639
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