Paper
15 March 2007 Development of optics for EUV lithography tools
Katsuhiko Murakami, Tetsuya Oshino, Hiroyuki Kondo, Hiroshi Chiba, Hideki Komatsuda, Kazushi Nomura, Hiromitsu Iwata
Author Affiliations +
Abstract
Nikon is now conducting a development of the full-field EUV exposure tools for EUVL process development named EUV1, which will be delivered in 2007. Polishing and coating of six different kinds of mirrors for the projection optics of EUV1 were finished and adjustment of the projection optics has been started. Sophisticated polishing process for aspheric mirrors, which can reduce LSFR, MSFR and HSFR down to less than 0.1nmRMS simultaneously, were developed. Process conditions of Mo/Si multilayer coatings have been optimized to obtain high reflectivity, low internal stress and graded coating simultaneously. Wavefront error of the projection optics under adjustment process is now 3nmRMS. We will try to achieve a wavefront error of less than 1nmRMS by further precise adjustment. Fabrication process of fly's eye mirrors, which is a key device of illumination optics of EUV1, was developed. All the mirrors of the illumination optics for EUV1 were finished and evaluation of its performance using an illumination-optics test stand has been started. Development and fabrication of both the projection optics and the illumination optics for EUV1 are satisfactorily in progress.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Katsuhiko Murakami, Tetsuya Oshino, Hiroyuki Kondo, Hiroshi Chiba, Hideki Komatsuda, Kazushi Nomura, and Hiromitsu Iwata "Development of optics for EUV lithography tools", Proc. SPIE 6517, Emerging Lithographic Technologies XI, 65170J (15 March 2007); https://doi.org/10.1117/12.711738
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KEYWORDS
Mirrors

Projection systems

Coating

Eye

Polishing

Wavefronts

Extreme ultraviolet lithography

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