Paper
21 March 2007 A heater plate assisted integrated bake/chill system for photoresist processing
Hui-Tong Chua, Arthur Tay, Yuheng Wang, Xiaodong Wu
Author Affiliations +
Abstract
A thermal processing module, which consists of a dense distribution of multivariate controlled heat/chill elements, is developed to achieve temperature uniformity of a silicon wafer throughout the processing temperature cycle of ramp, hold and quench in microlithography. In the proposed unit, the bake and chill steps are conducted sequentially within the same module without any substrate movement. The unit includes two heating sources. The first is a mica heater which serves as the dominant means for heat transfer. The second is a set of thermoelectric devices (TEDs) which are used to provide a distributed amount of heat to the substrate for uniformity and transient temperature control. The TEDs also provide active cooling for chilling the substrate to a temperature suitable for subsequent processing steps. The feasibility of a practical system is demonstrated via detailed modeling and simulations based on first principle heat transfer analysis.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hui-Tong Chua, Arthur Tay, Yuheng Wang, and Xiaodong Wu "A heater plate assisted integrated bake/chill system for photoresist processing", Proc. SPIE 6519, Advances in Resist Materials and Processing Technology XXIV, 65193H (21 March 2007); https://doi.org/10.1117/12.711688
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KEYWORDS
Semiconducting wafers

Mica

Control systems

Temperature metrology

Thermoelectric materials

Device simulation

Photoresist processing

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