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13 October 1986 Coherence Loss Due To Thin Film Interface Roughness
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Proceedings Volume 0652, Thin Film Technologies II; (1986) https://doi.org/10.1117/12.938393
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria
Abstract
Using a surface roughness model consisting of narrow columns of differing heights, the spectral transmittance and front and backside reflectance have been derived for a single layer on a smooth substrate. The effects of various amounts of surface roughness have been compared to various amounts of layer absorption. Surface roughness causes a more rapid loss of modulation with wavelength in transmission than absorption. It begins to act like incoherent light, which shows no wavelength fringing.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W H. Southwell "Coherence Loss Due To Thin Film Interface Roughness", Proc. SPIE 0652, Thin Film Technologies II, (13 October 1986); https://doi.org/10.1117/12.938393
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