Paper
11 April 2007 U.S. Army Corrosion Office's storage and quality requirements for military MEMS program
J. L. Zunino III, D. R. Skelton
Author Affiliations +
Abstract
As the Army transforms into a more lethal, lighter and agile force, the technologies that support these systems must decrease in size while increasing in intelligence. Micro-electromechanical systems (MEMS) are one such technology that the Army and DOD will rely on heavily to accomplish these objectives. Conditions for utilization of MEMS by the military are unique. Operational and storage environments for the military are significantly different than those found in the commercial sector. Issues unique to the military include; high G-forces during gun launch, extreme temperature and humidity ranges, extended periods of inactivity (20 years plus) and interaction with explosives and propellants. The military operational environments in which MEMS will be stored or required to function are extreme and far surpass any commercial operating conditions. Security and encryption are a must for all MEMS communication, tracking, or data reporting devices employed by the military. Current and future military applications of MEMS devices include safety and arming devices, fuzing devices, various guidance systems, sensors/detectors, inertial measurement units, tracking devices, radio frequency devices, wireless Radio Frequency Identifications (RFIDs) and network systems, GPS's, radar systems, mobile base systems and information technology. MEMS embedded into these weapons systems will provide the military with new levels of speed, awareness, lethality, and information dissemination. The system capabilities enhanced by MEMS will translate directly into tactical and strategic military advantages.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. L. Zunino III and D. R. Skelton "U.S. Army Corrosion Office's storage and quality requirements for military MEMS program", Proc. SPIE 6528, Nanosensors, Microsensors, and Biosensors and Systems 2007, 65280A (11 April 2007); https://doi.org/10.1117/12.716111
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Microelectromechanical systems

Reliability

Corrosion

Accelerated life testing

Sensors

Standards development

Weapons

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