18 April 2007 Multimode dynamics of atomic-force-microscope tip-sample interactions and application of sensitivity vector fields
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Abstract
The application of sensitivity vector fields (SVF) for tip-sample interactions in the context of multimode dynamics of atomic-force-microscopes (AFM) is presented. Analyzing sensitivity vector fields is a novel approach to determine simultaneous parameter variations of the system very accurately by exploiting the geometric features of observed chaotic dynamics. In certain operating condition, higher modes change the system dynamics significantly. Hence, higher order modes cannot be neglected. The paper demonstrates the accuracy of the SVF approach as applied to a multimode AFM model where mode shapes vary due to multiple variations of parameters.
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Joosup Lim, Bogdan I. Epureanu, "Multimode dynamics of atomic-force-microscope tip-sample interactions and application of sensitivity vector fields", Proc. SPIE 6529, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2007, 65293Y (18 April 2007); doi: 10.1117/12.715750; https://doi.org/10.1117/12.715750
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