17 November 1986 New Computer-Aided System For Automatic Fringe Analysis In Optical Metrologies
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Proceedings Volume 0654, Automatic Optical Inspection; (1986) https://doi.org/10.1117/12.938296
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria
Abstract
A new computer-aided system for automatic fringe analysis will be presented. This commercially available system is based on the phase-shift method. It enables the complete analysis of fringe patterns for various optical measuring techniques: 2-beam interferometry, speckle-interferometry, holography, photoelasticity, fringe-projecting methods, and Moire techniques.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B Breuckmann, B Breuckmann, W Thieme, W Thieme, "New Computer-Aided System For Automatic Fringe Analysis In Optical Metrologies", Proc. SPIE 0654, Automatic Optical Inspection, (17 November 1986); doi: 10.1117/12.938296; https://doi.org/10.1117/12.938296
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