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14 May 2007 Motheye structured surface fabrication as durable anti-reflection treatment on CdZnTe for space-based LWIR detector devices
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Abstract
Space based HgCdTe imaging devices, built on CdZnTe substrates, require radiation hardened anti-reflection (AR) treatments in order to withstand the rigors of the space environment. Conventional anti-reflection (AR) coatings provide adequate optical performance but are prone to delamination and degradation due to extreme temperature cycling and irradiation in space. Consequently, there is an intense need for improved AR technology that combines high optical performance with improved durability. Etching physical gradient or motheye structures directly into the CdZnTe eliminates the need to deposit additional layers of different materials onto the substrate, avoiding the possibility of delamination and cross contamination. Motheye AR surfaces, under development at Surmet Corporation, have demonstrated excellent broadband optical performance in the LWIR (7 to14 micron) waveband. Surmet's motheye technology involves direct etching of a regular pattern of fine features into the CdZnTe substrate, using standard lithography and dry etching techniques. The results from this ongoing research and development effort are discussed.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Neeta Agarwal, Lee M. Goldman, Suri Sastri, Robert Ondercin, and Paul Kobrin "Motheye structured surface fabrication as durable anti-reflection treatment on CdZnTe for space-based LWIR detector devices", Proc. SPIE 6542, Infrared Technology and Applications XXXIII, 65422B (14 May 2007); https://doi.org/10.1117/12.720202
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