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16 May 2007 Design of nonlinear optical waveguide sensors with metallic cores by uniform field profile approach
M. M. Abadla; M. M. Shabat
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Proceedings Volume 6585, Optical Sensing Technology and Applications; 65850P (2007) https://doi.org/10.1117/12.721173
Event: International Congress on Optics and Optoelectronics, 2007, Prague, Czech Republic
Abstract
TE waves can propagate in metal film of three waveguide structure if at least one of the covering media is nonlinear. The waveguide sensor under consideration consists of a metal wave guiding film coated with two nonlinear claddings. Contrary to what has been recently predicted, it is shown here that uniform field profile may be achieved under the suitable choice of the dielectric constants of the surroundings. Electric fields and fraction of power flow down the sensor layers are studied here. We expect this kind of planar waveguide sensors may be realized experimentally and will have applications in future opto-electronic devices. Uniform field approach has been discussed and implemented for the first time in investigating the waveguide sensors.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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M. M. Abadla and M. M. Shabat "Design of nonlinear optical waveguide sensors with metallic cores by uniform field profile approach", Proc. SPIE 6585, Optical Sensing Technology and Applications, 65850P (16 May 2007); https://doi.org/10.1117/12.721173
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