16 May 2007 Analysis of the sensitivity of integrated nonlinear optical evanescent wave sensors
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Abstract
The dispersion relations for TE polarized waves guided by thin dielectric film surrounded by a nonlinear cladding and a linear substrate are presented. The sensitivity of the effective refractive index on the cladding index in evanescent optical waveguide sensor is derived. Closed form analytical expressions and normalized charts are given to provide the conditions for the maximum sensitivity of nonlinear sensors when the measurand is homogeneously distributed in the semi-infinite waveguide cover (homogeneous sensing). The results will be compared with those of the well known linear evanescent wave sensors.
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S. Taya, M. M. Shabat, M. M. Abadla, H. M. Khalil, "Analysis of the sensitivity of integrated nonlinear optical evanescent wave sensors", Proc. SPIE 6585, Optical Sensing Technology and Applications, 65851A (16 May 2007); doi: 10.1117/12.721569; https://doi.org/10.1117/12.721569
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KEYWORDS
Sensors

Waveguides

Refractive index

Cladding

Wave sensors

Dielectrics

Thin films

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