31 May 2007 Measurement of modulation transfer function of infrared optoelectronic detector
Author Affiliations +
This paper details a method for measuring the MTF for optoelectronic detector. A description of a test facility for testing and evaluating MTF is given. We use a knife-edge target to measure MTF. The Pentium III computer system takes the charge of controlling and calculating.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lei Liu, Bing Chen, "Measurement of modulation transfer function of infrared optoelectronic detector", Proc. SPIE 6585, Optical Sensing Technology and Applications, 658525 (31 May 2007); doi: 10.1117/12.723336; https://doi.org/10.1117/12.723336


A new non uniformity correction algorithm for IRFPA based on...
Proceedings of SPIE (September 11 2013)
Performance trade-offs of infrared spectral imagers
Proceedings of SPIE (October 31 1997)
Evolution Of Infrared Instrumentation
Proceedings of SPIE (January 27 1981)
Infrared Technology For Imaging
Proceedings of SPIE (February 20 1973)

Back to Top