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31 May 2007 Measurement of modulation transfer function of infrared optoelectronic detector
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Abstract
This paper details a method for measuring the MTF for optoelectronic detector. A description of a test facility for testing and evaluating MTF is given. We use a knife-edge target to measure MTF. The Pentium III computer system takes the charge of controlling and calculating.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lei Liu and Bing Chen "Measurement of modulation transfer function of infrared optoelectronic detector", Proc. SPIE 6585, Optical Sensing Technology and Applications, 658525 (31 May 2007); https://doi.org/10.1117/12.723336
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