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Capillary-discharge 46.9-nm laser-induced damage to a-C thin films exposed to multiple laser shots below single-shot damage threshold
Applications of intense ultra-short XUV pulses to solid state physics: time-resolved luminescence spectroscopy and radiation damage studies
X-ray optics power considerations for high intensity x-ray free-electron lasers based on superconducting technology
Quantitative modelization of particle emission from excited solids: application to spectroscopic diagnostics of buried interfaces in multilayer
Debris- and radiation-induced damage effects on EUV nanolithography source collector mirror optics performance