Paper
18 May 2007 Quantitative modelization of particle emission from excited solids: application to spectroscopic diagnostics of buried interfaces in multilayer
Nicola Mahne, Angelo Giglia, Stefano Nannarone, Juri Bertoli, Valentina Mattarello, Valentino Rigato
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Abstract
The performance of multilayer optics depends on the quality of interfaces between spacer and absorber materials. Intermixing at the interfaces affects the optical behavior. An experimental method is presented here to obtain the amount of intermixing at the buried interfaces of multilayer structures. The method is based on the combined use of photoemission and a rocking scan through the Bragg peak. The possibility of obtaining quantitative information - through a phenomenological model - on the width of the intermixing region is presented and discussed.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nicola Mahne, Angelo Giglia, Stefano Nannarone, Juri Bertoli, Valentina Mattarello, and Valentino Rigato "Quantitative modelization of particle emission from excited solids: application to spectroscopic diagnostics of buried interfaces in multilayer", Proc. SPIE 6586, Damage to VUV, EUV, and X-ray Optics, 65860V (18 May 2007); https://doi.org/10.1117/12.722922
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KEYWORDS
Ruthenium

Interfaces

Silicon

Chemical elements

Photons

Metals

Solids

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