5 March 2007 Evaluation and testing of semiconductor laser reliability in optic system
Author Affiliations +
Proceedings Volume 6595, Fundamental Problems of Optoelectronics and Microelectronics III; 659505 (2007); doi: 10.1117/12.725682
Event: Fundamental Problems of Optoelectronics and Microelectronics III, 2006, Harbin, China
Abstract
In order to improve the performance of an optic system, a new evaluation and testing methodology for the light source which uses semiconductor laser is presented. A new system, combining high accuracy source and measure capabilities for pulsed testing, is developed to achieve the aim of automatic measurement of Light-Current-Power (LIV) for semiconductor laser. The test can provide customer with L-I, V-I curves and other correlative parameters, such as the threshold current and slope efficiency, and so on. Meanwhile, the change of environment temperature versus lasing wavelength under pulse injection is discussed, and the relationship between the lasing wavelength and the width and cycle of injection pulse is obtained. The temperature character of packaged laser unit is measured conveniently. Making use of the above examined curves and parameters, the reliability of semiconductor laser and quality of device can be compared directly and evaluated accurately. The technique is successfully applied for the evaluation of semiconductor laser reliability.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wenyan Tang, Xianguang Fan, Heyi Sun, "Evaluation and testing of semiconductor laser reliability in optic system", Proc. SPIE 6595, Fundamental Problems of Optoelectronics and Microelectronics III, 659505 (5 March 2007); doi: 10.1117/12.725682; https://doi.org/10.1117/12.725682
PROCEEDINGS
6 PAGES


SHARE
KEYWORDS
Semiconductor lasers

Reliability

Temperature metrology

Optical systems

Pulsed laser operation

Light sources

Automatic control

RELATED CONTENT

Practical TDM fiber sensor network
Proceedings of SPIE (September 24 1996)
Review of the Fiber Optic Control System Integration program
Proceedings of SPIE (December 01 1991)
Robotic grip-stress fiber-optic sensor
Proceedings of SPIE (September 22 1993)

Back to Top