5 March 2007 Experiment and analysis based on polarization optical time domain reflectometry (POTDR)
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Proceedings Volume 6595, Fundamental Problems of Optoelectronics and Microelectronics III; 659539 (2007) https://doi.org/10.1117/12.725895
Event: Fundamental Problems of Optoelectronics and Microelectronics III, 2006, Harbin, China
Abstract
New polarization properties have been observed from the Fresnel reflection on the waveforms of OTDR with the commercial OTDR produced by Anritsu company. Then a better POTDR system was established in order to discover the accurate properties, and more remarkable result was obtained by the Serial Data Analyser(SDA5000A).
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Zhengyong Li, Chongqing Wu, Yanfei Liu, Mu Cheng, Yongjun Wang, Changyong Tian, "Experiment and analysis based on polarization optical time domain reflectometry (POTDR)", Proc. SPIE 6595, Fundamental Problems of Optoelectronics and Microelectronics III, 659539 (5 March 2007); doi: 10.1117/12.725895; https://doi.org/10.1117/12.725895
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