5 March 2007 Experiment and analysis based on polarization optical time domain reflectometry (POTDR)
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Proceedings Volume 6595, Fundamental Problems of Optoelectronics and Microelectronics III; 659539 (2007) https://doi.org/10.1117/12.725895
Event: Fundamental Problems of Optoelectronics and Microelectronics III, 2006, Harbin, China
Abstract
New polarization properties have been observed from the Fresnel reflection on the waveforms of OTDR with the commercial OTDR produced by Anritsu company. Then a better POTDR system was established in order to discover the accurate properties, and more remarkable result was obtained by the Serial Data Analyser(SDA5000A).
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhengyong Li, Zhengyong Li, Chongqing Wu, Chongqing Wu, Yanfei Liu, Yanfei Liu, Mu Cheng, Mu Cheng, Yongjun Wang, Yongjun Wang, Changyong Tian, Changyong Tian, } "Experiment and analysis based on polarization optical time domain reflectometry (POTDR)", Proc. SPIE 6595, Fundamental Problems of Optoelectronics and Microelectronics III, 659539 (5 March 2007); doi: 10.1117/12.725895; https://doi.org/10.1117/12.725895
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