You have requested a machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Neither SPIE nor the owners and publishers of the content make, and they explicitly disclaim, any express or implied representations or warranties of any kind, including, without limitation, representations and warranties as to the functionality of the translation feature or the accuracy or completeness of the translations.
Translations are not retained in our system. Your use of this feature and the translations is subject to all use restrictions contained in the Terms and Conditions of Use of the SPIE website.
25 January 2007Dot-matrix holographic recording in amorphous chalcogenide films
We have developed PC controlled dot-matrix holographic recording system based on the CW diode pumped YAG:Nd
SHG laser (wavelength 532 nm, power 30mW,) modulated electronically with TTL signals. Two-beam technique has
been used with convergence angle 30o and PC controlled incident beam plane rotation 0-360o. Optical system consists of beam splitter, 40mm focus length forming cylindrical lens and 40mm focusing lens. Characteristic parameters of
experimental equipment are following: spot size - 50-200 micrometers, direct laser writing area, limited by x-y
positioning system, was 70mm x 70mm, number of writing head rotation positions up to 256 (8 bit), time of each
exposure - 1-1000 msec.
As the recording material we have used AsxSySe1-x chalcogenide glass material. Diffraction efficiency of written
gratings in the material in dot-matrix regime exceeds 25%. Original method for surface relief enhancement by etching
and subsequent electroplating has been developed. Special PC controlled device for thermal imprinting of relief
holograms on the metallized polyamide film has been built.
Measurements of light transmission, reflection, and diffraction phenomena of laser beams in processed chalcogenide
materials are discussed.