10 April 2007 X-ray diffraction analysis of oxidized Zr-based alloys
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Proceedings Volume 6597, Nanodesign, Technology, and Computer Simulations; 65970S (2007) https://doi.org/10.1117/12.726775
Event: Nanodesign, Technology, and Computer Simulations, 2006, Olsztyn, Poland
Abstract
In this contribution the comparative XRD study of ZrlNb and Zircaloy 4 is presented. The aim of the study is to determine residual stresses σ and to analyze the microstructure of oxide layers formed on tubular specimens oxidized under temperature transient conditions (oxidation in water at 360°C with a short-time shock in steam at 500°C). The specimens of the both alloys which had not undergone the temperature transition were also studied. A strongly quantitatively varied texture occurred in oxide layers of specimens oxidized under transient conditions. Thus, the average values of residual stresses σ and crystallite size D in oxide layers can be used as qualitative characteristic for the behavior of the two alloys.
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Galina Gosmanová, Galina Gosmanová, Ivo Kraus, Ivo Kraus, Michal Kolega, Michal Kolega, Věra Vrtílková, Věra Vrtílková, } "X-ray diffraction analysis of oxidized Zr-based alloys", Proc. SPIE 6597, Nanodesign, Technology, and Computer Simulations, 65970S (10 April 2007); doi: 10.1117/12.726775; https://doi.org/10.1117/12.726775
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