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22 June 2007 Usage of microplasma signal noise for solar cells diagnostic
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Proceedings Volume 6600, Noise and Fluctuations in Circuits, Devices, and Materials; 660017 (2007) https://doi.org/10.1117/12.724585
Event: SPIE Fourth International Symposium on Fluctuations and Noise, 2007, Florence, Italy
Abstract
This work deals with the usage of micro-plasmas signal noise for solar cells diagnostic. When high electric field is applied to PN junction with some technological imperfections it produces in tiny areas of enhanced impact ionization called micro-plasmas which could lead to deterioration in quality or destruction of PN junction. On this account it is possible to use methods which indicate presence of micro-plasma in junction and enable quality and quantitative description of tested cells.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jiri Vanek, Pavel Koktavy, Kristyna Kubickova, Petr Sadovsky, and Michal Raska "Usage of microplasma signal noise for solar cells diagnostic", Proc. SPIE 6600, Noise and Fluctuations in Circuits, Devices, and Materials, 660017 (22 June 2007); https://doi.org/10.1117/12.724585
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