11 June 2007 Noise characteristics and reliability of light emitting diodes based on nitrides
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Proceedings Volume 6600, Noise and Fluctuations in Circuits, Devices, and Materials; 66001H (2007) https://doi.org/10.1117/12.724538
Event: SPIE Fourth International Symposium on Fluctuations and Noise, 2007, Florence, Italy
Abstract
Optical and electrical noises and correlation factor between optical and electrical fluctuations of nitride-based light emitting diodes (LEDs) have been investigated under forward bias. Their electrical, optical and noise characteristics were compared with ones of LEDs of other materials. LED noise characteristic changes during aging have been measured, too. It is found that optical and electrical noise spectra under forward bias for more reliable LEDs distinguish by lower 1/f type fluctuations and Lorentzian type noise at higher frequencies. LEDs with intensive 1/f noise demonstrate shorter lifetime. It is shown that reason of LED degradation is related with defects presence in device structure. These defects can be formed during device fabrication or appear during operation. An analysis of LED current-voltage and electrical noise characteristics under forward and reverse bias has shown that LEDs with intensive 1/f electrical noise, large reverse current (low reverse breakdown voltage) and larger terminal voltage under forward bias distinguish by short lifetime.
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S. Pralgauskaitė, V. Palenskis, J. Matukas, J. Petrulis, G. Kurilčik, "Noise characteristics and reliability of light emitting diodes based on nitrides", Proc. SPIE 6600, Noise and Fluctuations in Circuits, Devices, and Materials, 66001H (11 June 2007); doi: 10.1117/12.724538; https://doi.org/10.1117/12.724538
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