11 June 2007 Correlation technique to reach ultimate resolution in noise measurements
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Proceedings Volume 6600, Noise and Fluctuations in Circuits, Devices, and Materials; 66001S (2007) https://doi.org/10.1117/12.727043
Event: SPIE Fourth International Symposium on Fluctuations and Noise, 2007, Florence, Italy
The Correlation Spectrum Analyzer, thanks to the presence of two independent acquisition channels, has demonstrated to reach very high performance in measuring noise spectra and to be extremely flexible in adapting to different devices under test (DUT) in term of impedance values, of flowing standing current, of DC applied voltage and of the physical quantity to be measured, either current or voltage. In addition, it can selectively extract the noise contribution of a specific current flow in multi-electrodes devices. The paper will briefly highlights these features together with the influence of the DUT characteristics, such as its impedance to ground and the cross-impedance between the two electrodes connected to the instrument input ports, in determining the ultimate limits in the performance of the instrument in terms of its sensitivity, its precision and its spectral extension. A practical realisation for measurements made with an AFM especially modified for correlation investigations is also commented.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Giorgio Ferrari, Giorgio Ferrari, Laura Fumagalli, Laura Fumagalli, Marco Sampietro, Marco Sampietro, } "Correlation technique to reach ultimate resolution in noise measurements", Proc. SPIE 6600, Noise and Fluctuations in Circuits, Devices, and Materials, 66001S (11 June 2007); doi: 10.1117/12.727043; https://doi.org/10.1117/12.727043

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