5 March 2007 Nanoscale linear measurements based on the attenuated total internal reflection: an interferometric approach
Author Affiliations +
Proceedings Volume 6604, 14th International School on Quantum Electronics: Laser Physics and Applications; 66040R (2007); doi: 10.1117/12.726902
Event: 14th International School on Quantum Electronics: Laser Physics and Applications, 2006, Sunny Beach, Bulgaria
Abstract
In this paper we describe a simple interferometric phasemeter which can be used as a linear sensor. This method is based on the interferometric restoration of both p- and s-components of the resultant field. The phase shift between them as a function of the attenuation of the total internal reflection can be determined from the interference signal. A lateral fringe shift and contrast variations were observed during the measurements. To explain these effects a simple theory is proposed. The resulting interferometrical signal is studied experimentally.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hristiyan Stoyanov, "Nanoscale linear measurements based on the attenuated total internal reflection: an interferometric approach", Proc. SPIE 6604, 14th International School on Quantum Electronics: Laser Physics and Applications, 66040R (5 March 2007); doi: 10.1117/12.726902; https://doi.org/10.1117/12.726902
PROCEEDINGS
5 PAGES


SHARE
KEYWORDS
Interferometry

Prisms

Sensors

Phase shifts

Polarization

Attenuators

Interferometers

Back to Top