Paper
12 April 2007 Application of Shack-Hartmann wavefront sensor for testing optical systems
Author Affiliations +
Proceedings Volume 6609, 15th Czech-Polish-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics; 660915 (2007) https://doi.org/10.1117/12.739665
Event: 15th Czech-Polish-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics, 2006, Liberec, Czech Republic
Abstract
Our work deals with a method of measurement of the wavefront shape using the lenslet array objective based on the Shack-Hartmann method. An analysis and computer simulation was carried out for the designed wavefront sensor, devoted to optical testing applications. The obtained accuracy is comparable to common interferometric techniques in optical industry, and it is sufficient for testing of optical elements and systems. Our work focuses on an application of the sensor for image quality testing of optical systems and measurement of centricity of optical systems. Several experiments were made for testing optical systems in UV and visible spectrum using the wavefront sensor, which verified the reliability and accuracy of the sensor for the case of optical system testing in optical industry.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jiri Novak, Pavel Novak, and Antonin Miks "Application of Shack-Hartmann wavefront sensor for testing optical systems", Proc. SPIE 6609, 15th Czech-Polish-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics, 660915 (12 April 2007); https://doi.org/10.1117/12.739665
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Cited by 3 scholarly publications.
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KEYWORDS
Wavefront sensors

Wavefronts

Optical testing

Microlens

Sensors

Microlens array

Diffraction

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