Realisation of a holographic microlaser scalpel using a digital micromirror device

Susanne Zwick; Michael Warber; Tobias Haist; Wolfgang Osten

doi:10.1117/12.727489

Abstract

Modern spatial light modulators (SLM) enable the generation of more or less arbitrary light fields in three dimensions. Such light fields can be used for different future applications in the field of biomedical optics. One example is the processing/cutting of biological material on a microscopic scale. By displaying computer generated holograms by suitable SLMs it is possible to ablate complex structures into three-dimensional objects without scanning with very high accuracy on a microscopic scale. To effectively cut biological materials by light, pulsed ultraviolet light is preferable. We will present a combined setup of a holographic laser scalpel using a digital micromirror device (DMD) and holographic optical tweezers using a liquid crystal display (LCD). The setup enables to move and cut or process micro-scaled objects like biological cells or tissue in three dimensions with high accuracy and without any mechanical movements just by changing the hologram displayed by the SLMs. We will show that holograms can be used to compensate aberrations implemented by the DMD or other optical components of the setup. Also we can generate arbitrary light fields like stripes, circles or arbitrary curves. Additionally we will present results for the fast optimization of holograms for the system. In particular we will show results obtained by implementing iterative Fourier transform based algorithms on a standard consumer graphics board (Nvidia 8800GLX). By this approach we are able to compute more than 360 complex 2D FFTs (512 × 512 pixels) per second with floating point precision.

Citation Download Citation

Susanne Zwick, Susanne Zwick, Michael Warber, Michael Warber, Tobias Haist, Tobias Haist, Wolfgang Osten, Wolfgang Osten, } "Realisation of a holographic microlaser scalpel using a digital micromirror device", Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66160N (18 June 2007); doi: 10.1117/12.727489; https://doi.org/10.1117/12.727489

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