Application of reflection hologram interferometry with a high resolution to residual stresses characterisation by local material removing

Vladimir S. Pisarev; Vitaly V. Balalov

doi:10.1117/12.726241

18 June 2007 Application of reflection hologram interferometry with a high resolution to residual stresses characterisation by local material removing

Vladimir S. Pisarev, Vitaly V. Balalov

Author Affiliations +

Proceedings Volume 6616, Optical Measurement Systems for Industrial Inspection V; 66162T (2007) https://doi.org/10.1117/12.726241
Event: Optical Metrology, 2007, Munich, Germany

Abstract

Residual stresses determination in thin-walled structures by combining the hole drilling method and reflection hologram interferometry is considered as a tool with some unique properties in the field of industrial inspection. The relations used for converting experimentally derived parameters into stress values of interest are presented. Required input data are obtained by simultaneous measurements of probe hole distortions in two principal strain directions on opposite sides of thin plane specimen. Emphasis is made on obtaining high-quality interferograms with high fringe density around small probe hole drilled in residual stress field. Such fringe patterns are capable of describing residual stress components of high level in a presence considerable stress gradients. It is shown that a resolution of ten fringes can be achieved over a hole of 1.5 mm diameter. Practical implementing developed technique is illustrated in the course of residual stresses characterisation near different welded joints of thin aluminium plates.

Citation Download Citation

Vladimir S. Pisarev and Vitaly V. Balalov "Application of reflection hologram interferometry with a high resolution to residual stresses characterisation by local material removing", Proc. SPIE 6616, Optical Measurement Systems for Industrial Inspection V, 66162T (18 June 2007); https://doi.org/10.1117/12.726241

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