Translator Disclaimer
2 July 2007 Measurements of adsorption strain in porous silicon by Raman scattering
Author Affiliations +
Proceedings Volume 6619, Third European Workshop on Optical Fibre Sensors; 661913 (2007) https://doi.org/10.1117/12.738402
Event: Third European Workshop on Optical Fibre Sensors, 2007, Napoli, Italy
Abstract
The stress in porous silicon during exposition to a liquid is investigated by an approach based on Raman scattering. When the porous silicon structure is exposed to isopropanol or ethanol, a reversible blue shift of the Raman spectra is observed. The blue shift of Raman scattering is ascribed to the contraction induced by the liquids that fill the pores.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. A. Ferrara, L. Sirleto, G. Messina, M. G. Donato, S. Santangelo, and I. Rendina "Measurements of adsorption strain in porous silicon by Raman scattering", Proc. SPIE 6619, Third European Workshop on Optical Fibre Sensors, 661913 (2 July 2007); https://doi.org/10.1117/12.738402
PROCEEDINGS
4 PAGES


SHARE
Advertisement
Advertisement
Back to Top