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3 March 2008 Technological improvements on the image quality in the low-intensity x-ray real-time imaging system
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Proceedings Volume 6621, International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection; 66210F (2008) https://doi.org/10.1117/12.790598
Event: International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007, 2007, Beijing, China
Abstract
In this paper, the noise and optical aberration which were two controllable factors that affect the image quality in the single-proximity-focusing x-ray image-intensifier were studied. By decreasing the electron gain of microchannel plate (MCP), the noise of the x-ray image-intensifier can be decreased. The optimal operating condition for the image intensifier and the CCD were also investigated. Based on this investigation, the flash-noise of the x-ray image-intensifier can be decreased and the brightness of the image can be improved. At the end of the paper, some results on the image-capturing of the cool CCD with low noise were presented.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ye Li, Guozheng Wang, Zhenlu Sun, Kui Wu, Li Chen, Xin Wang, Qingduo Duanmu, and Jingquan Tian "Technological improvements on the image quality in the low-intensity x-ray real-time imaging system", Proc. SPIE 6621, International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection, 66210F (3 March 2008); https://doi.org/10.1117/12.790598
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